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Metallurgical Mount Holder, 1-1/2" and 40mm Auto Probes With this mount there is

SKU: 2053389506

4.9
USD137.00 USD175.00

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Ships within 48 hours · Estimated delivery Aug 10 - Aug 15

Description

With this mount there is no need to tilt the SEM specimen stage which avoids drift and enables quick setup for EBSD analysis

mechanical and thermal properties same as glass filled Delrin®

Compatible with 45 x 25mm

200nm with 2 each 0

Variable Size Thin Section Holder

Metallurgical Mount Holder, 1-1/2" and 40mm Auto Probes With this mount there isDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

Exchange/Return Notes
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  • Final sale items are not eligible for returns or exchanges.
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