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xSol 17 High Load Berkovich DEKTAK XT Introduction
xSol 17 High Load Berkovich DEKTAK XT Introduction
xSol 17 High Load Berkovich DEKTAK XT Introduction
xSol 17 High Load Berkovich DEKTAK XT Introduction

xSol 17 High Load Berkovich DEKTAK XT Introduction

SKU: 34474987163

4.3
USD2000.00 USD2047.00

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Ships within 48 hours · Estimated delivery Aug 22 - Aug 27

Description

Introduction

Scanning probe microscopes have a pattern that is closely sized to the finest cantilever tips challenging their resolution ability

Built on the high-performance RFESP-75 AFM probe

for CPII / Innova

targets 3µm 2µm 1µm 1

xSol 17 High Load Berkovich DEKTAK XT IntroductionDESCRIPTION xSol 17 High Load Berkovich 3 sided pyramidal diamond probe for heating

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