SEM Magnification Standard and Stage Micrometer MRS-4 - Modification SPM Tools Incorporated into the standard are

Incorporated into the standard are X & Y rulers with 6mm length with 1µm increments

Splash guards are included with purchase of fluid cantilever holders

Optional retainer & mounting available

The pattern is coated with a proprietary conductive material which allows for SEM imaging at any accelerating voltage

- Topography imaging in PeakForce Tapping

SEM Magnification Standard and Stage Micrometer MRS-4 - Modification SPM Tools Incorporated into the standard areDESCRIPTION Modify the MRS 4 to 3mm diameter x 0. 5mm thickness to fit into a TEM style holder. For use only in secondary or backscattered mode, not transmitted The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies