Triple Flat Sample Clip Holder AFM and Scanning Probe Microscopy Calibration MMTMEC and MTFML

MMTMEC and MTFML

16326-20 - PELCO SEMClip™

15477 - PELCO® Bar Clamp Vise

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Bruker's flagship RESP probes are the preferred choice for high-sensitivity silicon probe imaging in contact mode in air

Triple Flat Sample Clip Holder AFM and Scanning Probe Microscopy Calibration MMTMEC and MTFMLDESCRIPTION Interchangeable Modular SEM Specimen Holders This extensive line of specimen holders all have a female M4 thread and are compatible with all of our modular SEM Stage Adapters. If used with the Jeol or ZEISS LEO dovetail stage adapter one of the adapter buttons 15372 or 15372 10 is needed. Triple Flat Sample Clip Holder, M4 shown with silicon chips held in place This specimen holder is made from aluminum with spring loaded clamping and