MRS-6 Magnification Reference Standard 1,500x - 1,000,000x - Magnification Reference Standards 00 and 3 MESP-HM-V2 probes

and 3 MESP-HM-V2 probes

05mm Packaging: 100 grids/vial for standard Cu

Styles available are Square Mesh

Leit-C-Plast™ is a conductive adhesive paste that can be molded to provide conductive paths to larger non-conductive samples when mounted on a specimen holder for SEM studies

400: Pitch 64µm

MRS-6 Magnification Reference Standard 1,500x - 1,000,000x - Magnification Reference Standards 00 and 3 MESP-HM-V2 probesDESCRIPTION MRS 6NT Reference Standard, X Y, Not Traceable, without Protective Retainer, Unmounted MRS 6XY Reference Standard, X Y, Traceable, without Protective Retainer, Unmounted 0. 08, 0. 1, 0. 2, 0. 5, 1, and 2m PITCH PATTERNS 3 BAR PATTERNS from . 08 TO 3m 1M PITCH TEST GRID X 20m 3 NM INDIVIDUAL PITCH 2 UNCERTAINTY! 2NM CUMULATIVE PITCH 2 UNCERTAIN This is the next generation, NIST and NPL (NIST counterpart in the U. K.) Traceable,